Overview

 

All smooth surfaces possess some degree of roughness, even if only at the atomic level. For man-made surfaces, this roughness arises from manufacturing processes that may involve chemical deposition, grinding, polishing, etching or several other commonly used techniques. Correct function of the fabricated component is often critically dependent on its degree of roughness. The Schmitt Measurement Systems (SMS) products measure this surface's micro-roughness and help engineers characterize material surfaces in advanced research, high-technology manufacturing and other industrial applications. These systems and instruments employ advanced laser light scatter technology.

 

Our Technology

 

SMS product technology employs methods of scatterometry. Here, a beam of light (often a laser) is directed onto a sample surface. The scattered light intensity is measured by an array of detectors or a single sampling detector which moves in an arc relative to the surface. The integral microprocessor measures BRDF (Bi-directional Reflectance Distribution Function) and TIS (Total Integrated Scatter) to determine RMS, Ra roughness and PSD, as well as other features for the area illuminated by the beam. Some instruments allow the spot to be scanned for random testing of several points on a surface or complete characterization of large surfaces. These products provide fast and repeatable non-contact surface microroughness measurements to leas's than 0.5 Angstrom, a level unachievable by competing device technologies.
 

Our Markets

 

SMS' texture measurement systems and CASI systems are typically used by engineers in high-technology manufacturing, general research, defense, electronics, space companies and makers of other optical instruments. Since the products can measure many different materials, including glass, ceramic and semiconductor wafers, the systems have been adapted to measure and evaluate advanced materials, lenses, magnetic storage media and a variety of semiconductor materials.

 

Our Advantages

 

The scatterometry technology of Schmitt Measurement Systems is unique in that it is both highly precise AND designed for commercial environments. Individual measurements to a fraction of an angstrom are conducted regardless of environmental factors such as temperature drifts and floor vibrations. Our systems are used in Quality Control and Quality Assurance departments for automated and volume testing. Unlike tactile profilimeters, our systems are completely non-contact and won't damage advanced materials. Additionally, our engineered systems can measure and characterize large surfaces, rather than the small areas (scanned by atomic force microscopes) that may not be representative of an entire sample.

 

> Visit the SMS website