Schmitt Measurement Systems-TMS 2000- DUV RC Measurement glass ceramic disk microroughness measurement

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TMS 2000 DUV-RC Machine

The TMS 2000 DUV-RC

Breaks the glass barrier with new Deep Ultraviolet technology.

The fastest, highest resolution, most stable non-contact microroughness measurement system in the world. Advanced light scatter technology packaged into a system ideally suited for qualifying and quantifying full surface textures and zone microroughness testing. For the first time surface measurements on glass and ceramic disk and wafer surfaces are now possible with new light scatter technology from
the leader in the field of light scatter. Discover the ultimate answer to fast, reliable microroughness measurements in glass/ceramic disk manufacturing, with systems that simplify lab to manufacturing correlation.

Features
Non-Contact Measurements cannot harm test surfaces Results – RA, RMS roughness from 1Å up to 500Å Cost – Lower costs than Profilometer, AFM or Interferometers Precision – Resolution of 0.01Å reproducibility +/-0.5Å or 1% and repeatability: +/-0.2 Å Speed – Typically 50 test points in 60 sec.

Benefits
Quadruple Production Throughput Increased Performance/Quality Unaffected by environmental conditions Minimal operator training required Lowest cost per measurement of any system Stable – Easy to use Correlates to other measurement instruments via slope/offset.