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Measurement Services |
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At Schmitt Industries we provide comprehensive and responsive measurement services
that our customers can depend on. Using the world's most advanced and accurate
light scatter instrument, the SMS CASI® Scatterometer, our measurement services
division can allow you to out source light scatter and surface roughness measurements.
Moreover, we maintain the world's most powerful light scatter laboratory, featuring
eight lasers that operate at 20 different wavelengths.
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| The CASI® at work in our lab. |
Schmitt offers complete light scatter analysis for industrial, military and
space optics applications. We routinely do measurements for such industry giants
as NASA, Lockheed Martin and Raytheon. Our professionally staffed measurement
laboratory is available on a per project or a daily rental basis. Measurement
results are provided on color plots and a diskette that includes SMS's complete
data analysis and display software package.
If you are new to light scatter and surface roughness measurement technology
and would like more information please review our technology overview. Conversely,
if you are already familiar with the technology we employ and would like more
specifics please look over the services we provide and our technical information.
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Our Services |
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Schmitt Industries is the leader in light scatter measurement services. The
combination of our highly trained personnel and the SMS CASI® Scatterometer
used in our laboratory makes us the clear choice for all your measurement needs.
We can provide measurement solutions for a wide variety of applications such as:
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| SMS CASI® Scatterometer. |
- Optical Surfaces
- Diffuse Materials
- Semiconductor Wafers
- Magnetic Storage Media
- Precision Machined Surfaces
- Cosmetic Appearance
The CASI uses laser light from UV to IR as a nondestructive probe to measure surfaced
quality, optical performance, smoothness, appearance, defects, and contamination
on a wide variety of materials.
The sample is mounted on stages capable of moving in X and Y and/or rotation.
The incident angle can be set to any angle up to 85° from surface normal.
The detector sweeps around the sample in the incident plane measuring scattered
and specular light. During the scan, the computer controls gain, filter, and aperture
changes through user-defined parameters. The instrument background is measured
separately and can be compared to the sample data.
The CASI Analysis Software simplifies analysis of scatter data. BRDF values
are used to calculate TIS, Total Hemispherical Reflectance, PSD, and RMS roughness.
Results are provided on color plots and a diskette that includes SMS's complete
data analysis and display software package. In addition, color printed viewgraphs
or publication ready figures can be provided.
To get a quotation or make lab reservations, please fill out our online lab reservation form.
If you would like more information or if you have a question we have not covered,
please contact our measurement services department
by filling out our contact us form.
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