| Q. |
I need my measurements done right away. What
is your typical turnaround time? |
| A. |
We have a typical turnaround time of less than five working days. |
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| Q. |
Can I rent the laboratory for an entire day? |
| A. |
Yes, our professionally staffed measurement laboratory is available on a daily
rental basis. |
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| Q. |
Do you have a database of previously scanned
data I can buy for a certain type of material? |
| A. |
Not necessarily. Data from our contract services is the property of the original
customer. We do not sell his or her data to anyone else. We may be able to put
you in contact with previous customers that have the data you are looking for,
but only with that customer's permission. |
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| Q. |
The sample I need measured is very small / large.
Can you measure this? |
| A. |
The smallest beam size we can produce on a sample is about 2mm diameter depending
on wavelength used. This limits sample size to be no smaller than ~2.5mm diameter.
The sample holder stage can carry up to a 10"x10" sample weighing as
much as 5lbs. This is the upper limit of sample size. Samples outside this range
might be possible to measure in our instrument, but special arrangements must
be discussed prior to price quotation. |
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| Q. |
What is the ideal sample to measure? |
| A. |
2" round or square flat is ideal. Smaller than 1" or larger than
5" becomes more difficult for mounting, aligning and handling. We usually
recommend the customer sends us the actual part / optic that is used in the system
they are trying to analyze, whatever size it may be. |
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| Q. |
Can you measure curved samples? |
| A. |
We can, but the data may become harder to interpret. The source beam is usually
adjusted to come to focus at the detector. In the signature scan, (which is the
scan of the source directly without a sample in the beam), the specular beam is
very thin and narrow. Then, with a flat optic or material that has no power to
change the focus position of the source beam, the specular transmission or reflection
from the sample will continue to focus at the detector. Placing the sample data
on top of the signature data, you will see the specular data from both to be the
same shape and width. The point where the sample data leaves the common specular
trace is easily interpreted as the level and angle of sample scatter. This is
usually a very small angle and a relatively accurate level of scatter. But, when
the sample changes the focus position, the sample data has a wider specular trace
than the signature trace, which can mask low angle scatter. The scatter data may
also be skewed due to the power of the sample. We offer some assistance in the
analysis of data due to focusing effects. Final interpretation of the effects
of a powered sample is left to the customer. |
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| Q. |
What is the basic process for contracting your
services?
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| A. |
First, discuss with us your plan for measurements. When both of us have determined
the best solution, we will write you a price quotation for that job. Then, you
must arrange a purchase order for that job and send it to us along with your samples.
As we begin with your measurements, we may contact you if unexpected results occur
to discuss any further or altered procedures. We finish by sending your data and
samples back to you. If possible, we will e-mail you the data as soon as it is
available. An invoice is mailed separate from the data and samples for payment
of services based on our terms with you.
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